Determining concentration depth profiles of thin foam films with neutral impact collision ion scattering spectroscopy
No Thumbnail Available
Date
2010
Authors
Ridings, Christiaan Rowland Paul
Andersson, Gunther
Journal Title
Journal ISSN
Volume Title
Publisher
Rights
Rights Holder
Abstract
Description
Keywords
Citation
Ridings, C.R.P. and Andersson, G. (2010). Determining concentration depth profiles of thin foam films with neutral impact collision ion scattering spectroscopy. Review of Scientific Instruments, 81(11) pp. 113907-1-113907-8.