ToF-SIMS characterisation of methane-and hydrogen-plasma-modified graphite using principal components analysis

dc.contributor.author Deslandes, Alec
dc.contributor.author Jasieniak, Marek
dc.contributor.author Shapter, Joseph George
dc.contributor.author Fairman, Callie
dc.contributor.author Gooding, John Justin
dc.contributor.author Hibbert, D B
dc.contributor.author Quinton, Jamie Scott
dc.contributor.author Ionescu, Mihail
dc.date.accessioned 2014-09-30T06:01:34Z
dc.date.available 2014-09-30T06:01:34Z
dc.date.issued 2009 en_US
dc.identifier.citation Deslandes, A., Jasieniak, M., Ionescu, M., Shapter, J.G., Fairman, C., Gooding, J.J., et al. (2009). ToF-SIMS characterisation of methane-and hydrogen-plasma-modified graphite using principal components analysis. Surface and Interface Analysis, 41 pp. 216-224. en
dc.identifier.doi https://doi.org/10.1002/sia.3010 en
dc.identifier.issn 0142-2421 en_US
dc.identifier.rmid 2006011867 en_US
dc.identifier.uri http://hdl.handle.net/2328/31479
dc.subject.forgroup 0204 Condensed Matter Physics en_US
dc.title ToF-SIMS characterisation of methane-and hydrogen-plasma-modified graphite using principal components analysis en_US
dc.type Article en_US
local.contributor.authorOrcidLookup Shapter, Joseph George: https://orcid.org/0000-0002-4000-2751 en_US
local.contributor.authorOrcidLookup Quinton, Jamie Scott: https://orcid.org/0000-0003-0088-7361 en_US
Files