Investigating the sensitivity of nitric oxide infrared emissions to electron impact

dc.contributor.author Campbell, Laurence
dc.contributor.author Brunger, Michael James
dc.contributor.author Allan, Roger M
dc.date.accessioned 2010-07-27T05:59:41Z
dc.date.available 2010-07-27T05:59:41Z
dc.date.issued 2008 en_US
dc.identifier.citation Campbell, L., Brunger, M.J., & Allan, M., 2008. Investigating the sensitivity of nitric oxide infrared emissions to electron impact. Journal of Physics: Conference Series, 115, 012003-1-012003-5. en
dc.identifier.doi https://doi.org/10.1088/1742-6596/115/1/012003 en
dc.identifier.issn 1742-6596 en_US
dc.identifier.rmid 2006009168 en_US
dc.identifier.uri http://hdl.handle.net/2328/9755
dc.subject.forgroup 0202 Atomic, Molecular, Nuclear, Particle and Plasma Physics en_US
dc.subject.forgroup 0904 Chemical Engineering en_US
dc.title Investigating the sensitivity of nitric oxide infrared emissions to electron impact en_US
dc.type Article en_US
local.contributor.authorOrcidLookup Brunger, Michael James: https://orcid.org/0000-0002-7743-2990 en_US
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