Investigating the sensitivity of nitric oxide infrared emissions to electron impact

dc.contributor.authorCampbell, Laurence
dc.contributor.authorBrunger, Michael James
dc.contributor.authorAllan, Roger M
dc.date.accessioned2010-07-27T05:59:41Z
dc.date.available2010-07-27T05:59:41Z
dc.date.issued2008en_US
dc.identifier.citationCampbell, L., Brunger, M.J., & Allan, M., 2008. Investigating the sensitivity of nitric oxide infrared emissions to electron impact. Journal of Physics: Conference Series, 115, 012003-1-012003-5.en
dc.identifier.doihttps://doi.org/10.1088/1742-6596/115/1/012003en
dc.identifier.issn1742-6596en_US
dc.identifier.rmid2006009168en_US
dc.identifier.urihttp://hdl.handle.net/2328/9755
dc.subject.forgroup0202 Atomic, Molecular, Nuclear, Particle and Plasma Physicsen_US
dc.subject.forgroup0904 Chemical Engineeringen_US
dc.titleInvestigating the sensitivity of nitric oxide infrared emissions to electron impacten_US
dc.typeArticleen_US
local.contributor.authorOrcidLookupBrunger, Michael James: https://orcid.org/0000-0002-7743-2990en_US
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