Measuring the electronic structure of disordered
overlayers by electron momentum spectroscopy: the Cu/Si interface
Measuring the electronic structure of disordered
overlayers by electron momentum spectroscopy: the Cu/Si interface
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Date
2006
Authors
Nixon, Kate Louise
Vos, M
Bowles, C
Ford, Michael J
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Nixon, K.L., Vos, M., Bowles, C., &
Ford, M., 2006. Measuring the electronic structure of disordered overlayers by electron
momentum spectroscopy: the Cu/Si interface. Surface and Interface Analysis, 38(8),
1236-1241.